Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control

Lin, W.-H.W.-H.LinBrar, V.W.V.W.BrarJariwala, D.D.JariwalaSherrott, M.C.M.C.SherrottTseng, W.-S.W.-S.TsengWu, C.-I.C.-I.WuYeh, N.-C.N.-C.YehAtwater, H.A.H.A.AtwaterCHIH-I WU2020-06-112020-06-112017https://scholars.lib.ntu.edu.tw/handle/123456789/498039Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Controljournal article10.1021/acs.chemmater.7b001832-s2.0-85020722517https://www.scopus.com/inward/record.uri?eid=2-s2.0-85020722517&doi=10.1021%2facs.chemmater.7b00183&partnerID=40&md5=f7f5a5ac02145604ae6f30e18a16ffc1