Liu Y.M.Sung H.-M.Wu Y.-S.Ma R.-W.Gracia J.Fujiwara H.Chen T.-LChou C.-H.CHEE-WEE LIU2025-10-272025-10-272025-01-01[9798331543129]https://scholars.lib.ntu.edu.tw/handle/123456789/732930falseReliability Study of Self-Aligned Top-Gated a-IGZO TFTs by N2 and N2O Plasma Treatmentconference paper2-s2.0-105010831667