Thermal conductivity measurement and interface thermal resistance estimation using SiO2 thin film

Chien, Heng-ChiehHeng-ChiehChienYao, Da-JengDa-JengYaoMEI-JIAU HUANGChang, Tien-YaoTien-YaoChang2011-02-112018-06-282011-02-112018-06-282008http://ntur.lib.ntu.edu.tw//handle/246246/222476en-US[SDGs]SDG7Thermal conductivity measurement and interface thermal resistance estimation using SiO2 thin filmjournal article10.1063/1.29272532-s2.0-44649122694