Chien, Yung ChiYung ChiChienLiu, Hsu WeiHsu WeiLiuTZONG-LIN WU2023-07-172023-07-172022-01-0115311309https://scholars.lib.ntu.edu.tw/handle/123456789/633709A theory of arrangements of measurements for obtaining the scattering matrix of a <inline-formula> <tex-math notation="LaTeX">$v$</tex-math> </inline-formula>-port circuit using a <inline-formula> <tex-math notation="LaTeX">$k$</tex-math> </inline-formula>-port vector network analyzer (VNA) is developed based on covering designs and Turán systems, which are two kinds of structures in combinatorial design theory. The results of this letter provide a general strategy for reducing the number of multiport measurements of microwave circuits.Covering design | covering number | design of experiments (DOE) | Impedance | Impedance measurement | Microwave circuits | Microwave measurement | multiport measurement | Scattering | scattering matrix | scattering parameter | Scattering parameters | Turán number | Turán system | vector network analyzer (VNA) | Wireless communicationReducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systemsjournal article10.1109/LMWC.2022.32152902-s2.0-85141584111https://api.elsevier.com/content/abstract/scopus_id/85141584111