On optimizing fault coverage, pattern count, and ATPG run time using a hybrid single-capture scheme for testing scan designs

Wu, S.S.WuWang, L.-T.L.-T.WangJiang, Z.Z.JiangSong, J.J.SongSheu, B.B.SheuWen, X.X.WenHsiao, M.S.M.S.HsiaoLi, J.C.-M.J.C.-M.LiHuang, J.-L.J.-L.HuangCHIEN-MO LIJIUN-LANG HUANG2020-06-112020-06-112008https://scholars.lib.ntu.edu.tw/handle/123456789/501349On optimizing fault coverage, pattern count, and ATPG run time using a hybrid single-capture scheme for testing scan designsconference paper10.1109/DFT.2008.292-s2.0-67649976838https://www.scopus.com/inward/record.uri?eid=2-s2.0-67649976838&doi=10.1109%2fDFT.2008.29&partnerID=40&md5=b4482aed0883cf9f612e5b8804dc3462