Chang, C.-M.C.-M.ChangYang, K.-J.K.-J.YangLi, J.C.-M.J.C.-M.LiCHIEN-MO LI2020-06-292020-06-292018https://scholars.lib.ntu.edu.tw/handle/123456789/505968Test pattern compression for probabilistic circuitsconference paper10.1109/ATS.2017.172-s2.0-85045185939https://www.scopus.com/inward/record.uri?eid=2-s2.0-85045185939&doi=10.1109%2fATS.2017.17&partnerID=40&md5=f6458f895cd990d0338aa7c2dd081624