Papers from the 22nd North American Conference on Molecular Beam Epitaxy-Oxides-Depth profiling the electronic structures at HfO2/Si interface grown by molecular beam epitaxy

Lay, TSTSLayChang, SCSCChangDin, GJGJDinYeh, CCCCYehHung, WHWHHungLee, WGWGLeeKwo, JJKwoMINGHWEI HONG2018-09-102018-09-102005http://scholars.lib.ntu.edu.tw/handle/123456789/315720Papers from the 22nd North American Conference on Molecular Beam Epitaxy-Oxides-Depth profiling the electronic structures at HfO2/Si interface grown by molecular beam epitaxyjournal article