Liu, C. W.C. W.LiuHsieh, T. X.T. X.HsiehLiuCW2009-03-252018-07-062009-03-252018-07-062000http://ntur.lib.ntu.edu.tw//handle/246246/148153application/pdf93800 bytesapplication/pdfen-USAnalytic modeling of the subthreshold behavior in MOSFETjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/148153/1/13.pdf