Mobility strain response and low temperature characterization of Ge p-MOSFETs

CHEE-WEE LIUWong, I.-H.I.-H.WongChen, Y.-T.Y.-T.ChenCiou, H.-J.H.-J.CiouChen, Y.-S.Y.-S.ChenYan, J.-Y.J.-Y.YanCHEE-WEE LIU2018-09-102018-09-102013http://www.scopus.com/inward/record.url?eid=2-s2.0-84890058060&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/380226Mobility strain response and low temperature characterization of Ge p-MOSFETsconference paper10.1109/DRC.2013.6633799