臺灣大學: 電信工程學研究所陳俊雄謝翰璋Hsieh, Han-ChangHan-ChangHsieh2013-03-272018-07-052013-03-272018-07-052011http://ntur.lib.ntu.edu.tw//handle/246246/252961本文主要針對射頻微波電路所產生之電磁干擾及耐受性問題，提出一快速分析技術平台，此平台中包含「電磁輻射干擾」及「電磁輻射耐受」二種新式快速分析模型。 首先，將單一微帶線含雙埠變數之電磁輻射方程式整合於一般商用電路設計軟體中，形成可模擬電磁輻射功能之新型電路設計平台。利用此平台設計射頻微波電路，即可同步快速、又有效率地計算出該電路特性及所產生之電磁輻射雜訊量，此新型快速分析平台特別適合處理具有x-軸與 y-軸微帶線結構所組成之射頻微波主動電路。 文中，另外將單一微帶線結構，面臨外在電磁波照射時，所感應之等效電壓及電流方程式，整合於商用電路設計平台中，同樣地，利用此新型平台設計射頻微波電路時，可同時處理該電路面臨外在電磁波照射時，所產生之輸出信號變動量。本新型分析平台具有模擬時間甚短之特點，故能針對複雜射頻微波電路運作於類比及數位調變信號條件下，所產生電磁耐受問題，提供一最佳並且有效率之估計方案。In this dissertation, efficient designed platforms, the spurious-emission and radiated-susceptibility simulation models, are proposed for analyzing two important electromagnetic compatibility (EMC) problems associated with the radio-frequency (RF) / microwave circuits. First, a new approach, that incorporates the two-port formulated analytical field expressions into a commercial circuit solver, is proposed and applied to develop the fast spurious-emission simulation model for characterizing the spurious emissions from RF/microwave circuits. Specifically, the developed model is efficient and quick in estimating the radiated emissions from the microstrip circuit structures, active and passive, with x- and y-directed wire elements on a printed circuit board (PCB). Next, the radiated-susceptibility simulation model, based on the equivalent- source expressions and circuit solver, is proposed for characterizing the field-influenced responses of the RF/microwave microstrip circuits which are illuminated by the external wave-field. With the merit of short simulation time, the proposed model would be very useful and efficient in characterizing the radiated susceptibility problems associated with the complicated RF/microwave circuits under analog/digital modulation schemes.2334371 bytesapplication/pdfen-US電磁相容電磁干擾電磁耐受Electromagnetic CompatibilitySpurious EmissionRadiated Susceptibilitythesishttp://ntur.lib.ntu.edu.tw/bitstream/246246/252961/1/ntu-100-D95942001-1.pdf