A New Analytic Formula for Minority Carrier Decay Length Extraction from Scanning Photocurrent Profiles in Ohmic-Contact Nanowire Devices

Chu, C.-H.C.-H.ChuMao, M.-H.M.-H.MaoYang, C.-W.C.-W.YangMING-HUA MAOHAO-HSIUNG LIN2020-06-042020-06-042019https://scholars.lib.ntu.edu.tw/handle/123456789/497092A New Analytic Formula for Minority Carrier Decay Length Extraction from Scanning Photocurrent Profiles in Ohmic-Contact Nanowire Devicesjournal article10.1038/s41598-019-46020-22-s2.0-85069267284https://www.scopus.com/inward/record.uri?eid=2-s2.0-85069267284&doi=10.1038%2fs41598-019-46020-2&partnerID=40&md5=c0606344525835ddfa5b99c589e1dc94