Infrared measurement of undercooling during silicon solidification on bare and Si<inf>3</inf>N<inf>4</inf> coated quartz substrates

Yang, C.F.C.F.YangTsoutsouva, M.G.M.G.TsoutsouvaHsu, H.P.H.P.HsuLan, C.W.C.W.LanCHUNG-WEN LAN2020-01-062020-01-062016https://scholars.lib.ntu.edu.tw/handle/123456789/444841[SDGs]SDG7Infrared measurement of undercooling during silicon solidification on bare and Si<inf>3</inf>N<inf>4</inf> coated quartz substratesjournal article10.1016/j.jcrysgro.2016.08.0262-s2.0-84982258438https://www.scopus.com/inward/record.uri?eid=2-s2.0-84982258438&doi=10.1016%2fj.jcrysgro.2016.08.026&partnerID=40&md5=5c0ecec547fa6b0ebfc8e13f4100a6fd