V. P.-H. HuM.-L. FanP. SuC.-T. ChuangVITA PI-HO HUV. P.-H. HuM.-L. FanP. SuC.-T. Chuang胡璧合2020-10-072020-10-072013https://scholars.lib.ntu.edu.tw/handle/123456789/516597Comparative Leakage Analysis of GeOI FinFET and Ge Bulk FinFETjournal article10.1109/ted.2013.22780322-s2.0-84884688857