B. Y. YeP. Y. YehS. Y. KuoI. Y. ChenSY-YEN KUO2018-09-102018-09-102009-04http://scholars.lib.ntu.edu.tw/handle/123456789/352024Design-for-Testability Techniques for Arithmetic Circuitsconference paper10.1109/CAS-ICTD.2009.49608062-s2.0-70149117726