The correlation between trap states and mechanical reliability of amorphous Si:H TFTS for flexible electronics

Lee, M.H.M.H.LeeChang, S.T.S.T.ChangWeng, S.-C.S.-C.WengLiu, W.-H.W.-H.LiuChen, K.-J.K.-J.ChenHo, K.-Y.K.-Y.HoLiao, M.H.M.H.LiaoHuang, J.-J.J.-J.HuangHu, G.-R.G.-R.HuMING-HAN LIAO2020-01-132020-01-132009https://scholars.lib.ntu.edu.tw/handle/123456789/447978The correlation between trap states and mechanical reliability of amorphous Si:H TFTS for flexible electronicsconference paper10.1109/IRPS.2009.51733882-s2.0-70449130405https://www.scopus.com/inward/record.uri?eid=2-s2.0-70449130405&doi=10.1109%2fIRPS.2009.5173388&partnerID=40&md5=0a654c9761dcf3d27747c33bc20ab838