XPS Depth Profiling of Organic Thin-Films using C60 Sputtering

Chen, Ying-YuYing-YuChenYu, Bang-YingBang-YingYuHsu, Mao-FengMao-FengHsuWang, Wei-BenWei-BenWangLin, Wei-ChunWei-ChunLinLin, Yu-ChinYu-ChinLinJou, Jwo-HueiJwo-HueiJouShyue, Jing-JongJing-JongShyue2010-09-282018-06-282010-09-282018-06-282008-11http://ntur.lib.ntu.edu.tw//handle/246246/206758en-USXPS Depth Profiling of Organic Thin-Films using C60 Sputteringjournal article