Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST.

Cheng, Kwang-TingKwang-TingChengCHIH-JEN LIN2020-05-042020-05-041995https://scholars.lib.ntu.edu.tw/handle/123456789/488001Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST.conference paper10.1109/TEST.1995.529878https://doi.org/10.1109/TEST.1995.529878