Defect study of GaN based LED structure by electron beam induced current

CHIH-CHUNG YANGGrinys, T.T.GrinysJelmakas, E.E.JelmakasReklaitis, I.I.ReklaitisLapinskas, S.S.LapinskasKadys, A.A.KadysMalinauskas, T.T.MalinauskasLin, C.-H.C.-H.LinYang, C.-C.C.-C.YangToma?iunas, R.R.Toma?iunasCHIH-CHUNG YANG2018-09-102018-09-102014http://www.scopus.com/inward/record.url?eid=2-s2.0-84898542018&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/385607Defect study of GaN based LED structure by electron beam induced currentjournal article10.1002/pssc.201300683