Prolonged Transient Behavior of Ultrathin Oxide MIS-Tunneling Diode Induced by Deep Depletion of Surrounded Coupling Electrode

Hsu, T.-H.T.-H.HsuJENN-GWO HWU2021-05-052021-05-052020https://www.scopus.com/inward/record.url?eid=2-s2.0-85090274971&partnerID=40&md5=aa8784a221896ca1daab055f541861dbhttps://scholars.lib.ntu.edu.tw/handle/123456789/559024Prolonged Transient Behavior of Ultrathin Oxide MIS-Tunneling Diode Induced by Deep Depletion of Surrounded Coupling Electrodejournal article10.1109/TED.2020.29980992-s2.0-85090274971WOS:000552976100061