Easily testable data path allocation using input/output registers

Dept. of Electr. Eng., National Taiwan Univ.Huang, Li-RenLi-RenHuangJou, Jing-YangJing-YangJouKuo, Sy-YenSy-YenKuoLiao, Wen-BinWen-BinLiao2007-04-192018-07-062007-04-192018-07-061996-11http://ntur.lib.ntu.edu.tw//handle/246246/2007041910031964application/pdf664287 bytesapplication/pdfen-USEasily testable data path allocation using input/output registersjournal article10.1109/ATS.1996.555151http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910031964/1/00555151.pdf