Direct Indication of Interface Trap States in an Mos Capacitor From the Peaks of Optical illumination-induced Capacitances

JENN-GWO HWU2018-09-102018-09-101987http://www.scopus.com/inward/record.url?eid=2-s2.0-0023382989&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/329954Direct Indication of Interface Trap States in an Mos Capacitor From the Peaks of Optical illumination-induced Capacitancesjournal article10.1080/02533839.1987.9676992