國立臺灣大學電子工程學研究所Li, Chien-Mo JamesChien-Mo JamesLiMcCluskey, Edward J.Edward J.McCluskey2006-11-152018-07-102006-11-152018-07-102005-11http://ntur.lib.ntu.edu.tw//handle/246246/200611150121533Aresistive-open defect is an imperfect circuit connection that can be modeled as a defect resistor between two circuit nodes that should be connected. A stuck-open (SOP) defect is a complete break (no current flow) between two circuit nodes that should be connected. Conventional single stuck-at fault diagnosis cannot precisely diagnose these two defects because the test results of defective chips depend on the sequence of test patterns. This paper presents precise diagnosis techniques for these two defects. The diagnosis techniques take the test-pattern sequence into account, and therefore, produce precise diagnosis results. Also, our diagnosis technique handles multiple faults of different fault models. The diagnosis techniques are validated by experimental results. Twelve SOP and one resistive-open chips are diagnosed out of a total of 459 defective chips.application/pdf326777 bytesapplication/pdfzh-TWAutomatic test pattern generation (ATPG)fault diagnosistestingvery large scale integration (VLSI)journal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/200611150121533/1/2327.pdf