Diagnosis of Resistive and Stuck-open Defects in Digital CMOS IC

CHIEN-MO LILi, J. C.-M.J. C.-M.LiE. J. McCluskeyCHIEN-MO LI2018-09-102018-09-102005-11http://scholars.lib.ntu.edu.tw/handle/123456789/318030Diagnosis of Resistive and Stuck-open Defects in Digital CMOS ICjournal article10.1109/tcad.2005.8524572-s2.0-27744441772WOS:000232971600008