A Configurable Integrated Test Methodology for Monolithic Microwave Integrated Circuit Production

Wang, H.H.WangYang, D.C.D.C.YangEsfandiari, R.R.EsfandiariJoseph, T.T.JosephEllis, R.K.R.K.EllisNg, G.G.NgHUEI WANG2020-06-042020-06-041992https://scholars.lib.ntu.edu.tw/handle/123456789/497377A Configurable Integrated Test Methodology for Monolithic Microwave Integrated Circuit Productionjournal article10.1109/66.1498162-s2.0-0026903457https://www.scopus.com/inward/record.uri?eid=2-s2.0-0026903457&doi=10.1109%2f66.149816&partnerID=40&md5=4d574de30a8135ce41f09cba88995d90