The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks

Dept. of Electr. Eng., National Taiwan Univ.Lu, Hsin-ChiaHsin-ChiaLuChu, Tah-HsiungTah-HsiungChu2007-04-192018-07-062007-04-192018-07-062004-06http://www.scopus.com/inward/record.url?eid=2-s2.0-4544349732&partnerID=MN8TOARShttp://ntur.lib.ntu.edu.tw//handle/246246/200704191002733http://ntur.lib.ntu.edu.tw/bitstream/246246/200704191002733/1/01338952.pdfapplication/pdf318273 bytesapplication/pdfen-US[SDGs]SDG7The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networksconference paper10.1109/MWSYM.2004.13389522-s2.0-4544349732http://ntur.lib.ntu.edu.tw/bitstream/246246/200704191002733/1/01338952.pdf