Hsiou Y.-FChen CChan C.-HStobinski LYING-JAY YANG2023-06-092023-06-092005214922https://www.scopus.com/inward/record.uri?eid=2-s2.0-23944520802&doi=10.1143%2fJJAP.44.4245&partnerID=40&md5=f6e3c4bd1a59180fd150b3504c34ae63https://scholars.lib.ntu.edu.tw/handle/123456789/632261The low-temperature transport properties of individual multiwalled carbon nanotubes are investigated at low temperatures using the multiple-probe technique. A low-ohmic contact between an electrode and a tube is prepared to prevent the influence of contact. Measurements using two- and four-probe techniques show Coulomb oscillations with nearly the same periods, indicating that the tunneling barriers are inside the tubes between each pair of electrodes. The experiment and the theoretical simulation suggest the existence of local barriers being responsible for the formation of a chain of weakly coupled islands and for the observed Coulomb blockade characteristics. © 2005 The Japan Society of Applied Physics.Carbon nanotube; Coulomb blockade; Defect; Multiwalled carbon nanotube; Tunneling barriers[SDGs]SDG14Computer simulation; Coulomb blockade; Defects; Electrodes; Electron tunneling; Transport properties; Low temperatures; Low-ohmic contact; Multiwalled carbon nanotubes; Tunneling n\barriers; Carbon nanotubesDefect effect on electrical transport of multiwalled carbon nanotubesjournal article10.1143/JJAP.44.42452-s2.0-23944520802