Residual thermal strain in thick GaN epifilms revealed by cross-sectional Raman scattering and cathodoluminescence spectra

Wang, F.C.F.C.WangCheng, C.L.C.L.ChengChen, Y.F.Y.F.ChenHuang, C.F.C.F.HuangYang, C.C.C.C.YangYANG-FANG CHENCHIH-CHUNG YANG2018-09-102018-09-102007http://www.scopus.com/inward/record.url?eid=2-s2.0-34547407201&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/330307[SDGs]SDG15Residual thermal strain in thick GaN epifilms revealed by cross-sectional Raman scattering and cathodoluminescence spectrajournal article10.1088/0268-1242/22/8/0122-s2.0-34547407201WOS:000248674100013