Testing of TSV-induced small delay faults for 3-D integrated circuits

Chun-Yi KuoChi-Jih ShihYi-Chang LuJames C.-M. LiKrishnendu ChakrabartyYI-CHANG LUCHIEN-MO LI2019-10-312019-10-31201410638210https://scholars.lib.ntu.edu.tw/handle/123456789/429927[SDGs]SDG7Testing of TSV-induced small delay faults for 3-D integrated circuitsjournal article10.1109/tvlsi.2013.22503202-s2.0-84895927211