李建模臺灣大學：電子工程學研究所莊惟舜Chuang, Wei-ShunWei-ShunChuang2007-11-272018-07-102007-11-272018-07-102007http://ntur.lib.ntu.edu.tw//handle/246246/57241本論文提出一個掃描鏈診斷技術可定位掃描鏈上的多重時序錯誤。跳躍模擬是一種新穎的平行模擬技術，儘管時序錯誤之間會產生互動，此技術仍能快速找出每個個別錯誤的上邊界及下邊界。此項技術只需要一般的自動測試向量即可，不需要特殊的診斷向量，使得這項技術對生產測試環境上的診斷非常有用。在ISCAS’89基準電路的實驗顯示，即使在一條超過八百個掃描細胞的掃描鏈上有十六個保持時間錯誤，此項技術能夠相當成功的指出幾乎每個錯誤的位置。當錯誤資料相當有限或是錯誤叢聚在一起時，本論文提出的技術仍然十分有效。This thesis presents a diagnosis technique to locate multiple timing faults in scan chains. Jump simulation is a novel parallel simulation technique which quickly searches for the upper and the lower bounds of every individual fault, in spite of the interaction of multiple faults. This technique requires only regular ATPG patterns, not specialized diagnosis patterns, which make it very useful for diagnosis in the production test environment. Experiments on ISCAS’89 benchmark circuits show that, this technique can successfully pinpoint almost every one of sixteen hold-time faults in a scan chain of more than 800 scan cells. The proposed technique is still effective when the failure data is limited or the faults are clustered.摘要 I Abstract II Table of Contents III List of Figures V List of Tables VII Chapter 1 Introduction 1 1.1 Motivation 1 1.2 Jump Simulation for Scan Chain Diagnosis 3 1.3 Contributions 4 1.4 Organization 5 Chapter 2 Background and Previous Work 7 2.1 Previous Works 8 2.2 Definitions 17 2.3 Jump Simulation for Single Fault Diagnosis 23 Chapter 3 Jump Simulation for Multiple Timing Fault Diagnosis 28 3.1 Overall Diagnosis Flow 29 3.2 UB Jump Simulation 31 3.3 Update UB 38 3.4 LB Jump Simulation 40 3.5 Update LB 41 3.6 SO Observation 43 3.7 Exhaustive Simulation 47 Chapter 4 Experimental Results 51 4.1 HT Fault 53 4.2 Five Types of Timing Faults 55 4.3 BR vs. Patterns and BR vs. Simulations 58 4.4 Limited Failure Data 60 4.5 Clustered Faults 61 Chapter 5 Discussions and Future Work 64 5.1 Discussions 64 5.1.1. Intermittent Faults 64 5.1.2 Multiple Faulty Chains 65 5.1.3 Inversions in Scan Chains 65 5.2 Future Work 66 5.2.1 X-filling to Improve Diagnosis Resolution 66 5.2.2 Generalized Exhaustive Simulation 67 Chapter 6 Summary 68 References 69543108 bytesapplication/pdfen-US掃描鏈錯誤診斷自動向量產生Fault diagnosisATPGscan chainthesishttp://ntur.lib.ntu.edu.tw/bitstream/246246/57241/1/ntu-96-R94943155-1.pdf