Applications of damage models to reliability investigations for input/output electronic connectors

KUO-CHI LIAO2018-09-102018-09-102006http://www.scopus.com/inward/record.url?eid=2-s2.0-84920632493&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/321619Applications of damage models to reliability investigations for input/output electronic connectorsconference paper2-s2.0-84920632493