A leakage-current-recycling phase-locked loop in 65nm CMOS technology

I-Ting LeeYun-Ta TsaiSHEN-IUAN LIU2018-09-102018-09-102012-11http://scholars.lib.ntu.edu.tw/handle/123456789/374059[SDGs]SDG7A leakage-current-recycling phase-locked loop in 65nm CMOS technologyjournal article10.1109/jssc.2012.22098102-s2.0-84869205665WOS:000310888200013