Raman scattering as a characterization tool for epitaxial GaN thin films grown on sapphire by turbo disk metalorganic chemical vapor deposition

Feng, Z.C.Z.C.FengSchurman, M.M.SchurmanStall, R.A.R.A.StallPavloski &amp, M.M.Pavloski &ampWhitley, A.A.Whitley2010-09-022018-07-052010-09-022018-07-051997-01http://ntur.lib.ntu.edu.tw//handle/246246/193702en-USRaman scattering as a characterization tool for epitaxial GaN thin films grown on sapphire by turbo disk metalorganic chemical vapor depositionjournal article