Test Pattern Modification for Average IR-Drop Reduction

Ding, W.-S.W.-S.DingHsieh, H.-Y.H.-Y.HsiehHan, C.-Y.C.-Y.HanLi, J.C.-M.J.C.-M.LiWen, X.X.WenCHIEN-MO LI2020-06-292020-06-292016https://scholars.lib.ntu.edu.tw/handle/123456789/505983Test Pattern Modification for Average IR-Drop Reductionjournal article10.1109/TVLSI.2015.23912912-s2.0-84927779731https://www.scopus.com/inward/record.uri?eid=2-s2.0-84927779731&doi=10.1109%2fTVLSI.2015.2391291&partnerID=40&md5=f6f8a5bc5445e5508772b4ee6a6adea5