Transmission electron microscopy characterization of HfO <inf>2</inf>/GaAs(001) heterostructures grown by molecular beam epitaxy

Liou, S.C.S.C.LiouChu, M.-W.M.-W.ChuChen, C.H.C.H.ChenLee, Y.J.Y.J.LeeChang, P.P.ChangLee, W.C.W.C.LeeMINGHWEI HONGKwo J.2019-12-272019-12-272008https://scholars.lib.ntu.edu.tw/handle/123456789/443424Transmission electron microscopy characterization of HfO <inf>2</inf>/GaAs(001) heterostructures grown by molecular beam epitaxyjournal article10.1007/s00339-008-4493-32-s2.0-43449110706https://www.scopus.com/inward/record.uri?eid=2-s2.0-43449110706&doi=10.1007%2fs00339-008-4493-3&partnerID=40&md5=ede99719bb727b811221b931bc5d6aaf