Comparative Study of Trace Metrics between Bibliometrics and Patentometrics

Ye, F. Y.F. Y.YeHuang, M. H.M. H.HuangChen, D. Z.D. Z.Chen2019-02-232019-02-232016https://scholars.lib.ntu.edu.tw/handle/123456789/403909https://www.scopus.com/inward/record.uri?eid=2-s2.0-85057623923&doi=10.20309%2fjdis.201611&partnerID=40&md5=313ca7e5950ebeee9efad819e7bd7e90Comparative Study of Trace Metrics between Bibliometrics and Patentometricsjournal article10.20309/jdis.2016112-s2.0-85057623923