Residual Charges Effect on the Annealing Behavior of Co-60 Irradiated MOS Capacitors

Hwu, J.-G.J.-G.HwuLee, G. S.G. S.LeeLee, Si-ChenSi-ChenLeeWang, Way-SeenWay-SeenWang2009-02-042018-07-062009-02-042018-07-061988http://ntur.lib.ntu.edu.tw//handle/246246/120858Residual Charges Effect on the Annealing Behavior of Co-60 Irradiated MOS Capacitorsjournal article10.1109/23.12867