Efficient test-point selection for scan-based BIST

CHIH-JEN LINTsai, H.-C.H.-C.TsaiCheng, K.-T.K.-T.ChengLin, C.-J.C.-J.LinBhawmik, S.S.BhawmikCHIH-JEN LIN2018-09-102018-09-101998http://www.scopus.com/inward/record.url?eid=2-s2.0-0032297062&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/343216Efficient test-point selection for scan-based BISTjournal article10.1109/92.736140