Microstructure, resistivity and the anisotropy of the upper critical field in NbN thin films

Rudman, D.D.RudmanJ. JuangR. van DoverNakahara, S.S.NakaharaCapone, D.D.CaponeTalvacchio, J.J.TalvacchioJIA-YANG JUANG2020-01-132020-01-1319870018-9464https://scholars.lib.ntu.edu.tw/handle/123456789/447604Microstructure, resistivity and the anisotropy of the upper critical field in NbN thin filmsjournal article10.1109/TMAG.1987.1065011http://ieeexplore.ieee.org/document/1065011/