An investigation about the limitation of strained-Si technology

Liao, M.H.M.H.LiaoYeh, L.L.YehLu, J.C.J.C.LuYu, M.H.M.H.YuWang, L.T.L.T.WangWu, J.J.WuJeng, P.-R.P.-R.JengLee, T.-L.T.-L.LeeJang, S.S.JangMING-HAN LIAO2020-01-132020-01-132009https://scholars.lib.ntu.edu.tw/handle/123456789/447977An investigation about the limitation of strained-Si technologyconference paper10.1109/VTSA.2009.51592772-s2.0-68349159734https://www.scopus.com/inward/record.uri?eid=2-s2.0-68349159734&doi=10.1109%2fVTSA.2009.5159277&partnerID=40&md5=873c11e6cf9b6a25c911370bd45af12f