An analysis of the kink phenomenon of scattering parameter S22 in RF power MOSFETs for system-on-chip (SOC) applications

SHEY-SHI LU2018-09-102018-09-102003http://www.scopus.com/inward/record.url?eid=2-s2.0-0037420174&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/303335[SDGs]SDG7An analysis of the kink phenomenon of scattering parameter S22 in RF power MOSFETs for system-on-chip (SOC) applicationsjournal article10.1002/mop.10767