Defect-Tolerant Hierarchical Sorting Networks for Wafer-Scale Integration

SY-YEN KUO2020-06-112020-06-111991https://scholars.lib.ntu.edu.tw/handle/123456789/500877Defect-Tolerant Hierarchical Sorting Networks for Wafer-Scale Integrationjournal article10.1109/4.849372-s2.0-0026221142https://www.scopus.com/inward/record.uri?eid=2-s2.0-0026221142&doi=10.1109%2f4.84937&partnerID=40&md5=7c35bacae4de81e09ddafaf8fd6a2779