Tseng, P.-H.P.-H.TsengHwu, J.-G.J.-G.HwuJENN-GWO HWU2018-09-102018-09-102014http://www.scopus.com/inward/record.url?eid=2-s2.0-84887233313&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/385267Corner induced non-uniform electric field effect on the electrical reliability of metal-oxide-semiconductor devices with non-planar substratesjournal article10.1016/j.sse.2013.10.009