Automatic functional test program generation for microprocessors

Dept. of Electr. Eng., National Taiwan Univ.Lin, C.-S.C.-S.LinHo, H.-F.H.-F.Ho2007-04-192018-07-062007-04-192018-07-061988-06http://ntur.lib.ntu.edu.tw//handle/246246/2007041910032129application/pdf38245 bytesapplication/pdfen-USAutomatic functional test program generation for microprocessorsjournal article10.1109/DAC.1988.14825http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910032129/1/00014825.pdf