The correlation of surface defects and reverse breakdown of 4H-SiC Schottky barrier diodes

KUNG-YEN LEECapano, Michael A.Michael A.Capano2020-01-172020-01-172007https://www.scopus.com/inward/record.uri?eid=2-s2.0-34249330681&doi=10.1007%2fs11664-006-0075-3&partnerID=40&md5=ef902db42170e3fd8a1088aae65100b2[SDGs]SDG14The correlation of surface defects and reverse breakdown of 4H-SiC Schottky barrier diodesjournal article10.1007/s11664-006-0075-32-s2.0-34249330681