An IR-drop aware test pattern generator for scan-based at-speed testing

P.-F. HouY.-T. LinJ.-L. HuangA. ShihZ. F. ConroyJIUN-LANG HUANG2019-10-312019-10-31201610817735https://scholars.lib.ntu.edu.tw/handle/123456789/429674An IR-drop aware test pattern generator for scan-based at-speed testingconference paper10.1109/ats.2016.232-s2.0-85010223198