Stability of amorphous silicon thin film transistors under prolonged high compressive strain

Chen, J. Z.J. Z.ChenCherenack, K.K.CherenackTsay, C.C.TsayCheng, I.-C.I.-C.ChengWagner, S.S.WagnerJackson, W.W.JacksonPerlov, C.C.PerlovTaussig, C.C.Taussig2010-10-202018-06-292010-10-202018-06-292007http://ntur.lib.ntu.edu.tw//handle/246246/217607en-US[SDGs]SDG7Stability of amorphous silicon thin film transistors under prolonged high compressive strain10.1557/PROC-0989-A09-04