Dept. of Electr. Eng., National Taiwan Univ.J. J. HuangJIUN-LANG HUANG2018-09-102018-09-102003-1110817735https://www.scopus.com/inward/record.uri?eid=2-s2.0-17644390511&doi=10.1109%2fATS.2003.1250833&partnerID=40&md5=b2646d2d205999ddcc5b3fe0ed48a23cIn this paper, we present a technique to measure the RMS period jitter of the signal under test. In the proposed approach, the lead/lag relationships between the signal under test and two delayed versions of itself are compared. The collected information corresponds to two points along the jitter's cumulative distribution function (CDF) curve from which the RMS period jitter value can be derived. Currently, SPICE simulation results show less than 5% error for RMS jitter values ranging from 40 to 60 ps. © 2003 IEEE.application/pdf270452 bytesapplication/pdfDistribution functions; SPICE; Cumulative distribution function; Jitter measurements; Low costs; Period jitter; RMS jitter; SPICE simulations; Two-point; Jitterconference paper10.1109/ATS.2003.12508332-s2.0-17644390511WOS:000240143200002