AlN films on GaN: Sources of error in the photoemission measurement of electron affinity

CHIH-I WUBermudez, V.M.V.M.BermudezWu, C.-I.C.-I.WuKahn, A.A.KahnCHIH-I WU2018-09-102018-09-102001http://www.scopus.com/inward/record.url?eid=2-s2.0-18044401316&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/293784AlN films on GaN: Sources of error in the photoemission measurement of electron affinityjournal article10.1063/1.1333716