Two-state trap-assisted tunneling current characteristics in Al 2O 3/SiO 2/SiC structures with ultrathin dielectrics

JENN-GWO HWU2018-09-102018-09-102012http://www.scopus.com/inward/record.url?eid=2-s2.0-84866072829&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/370331Two-state trap-assisted tunneling current characteristics in Al 2O 3/SiO 2/SiC structures with ultrathin dielectricsjournal article10.1109/TNANO.2012.2202399