Lin, E.W.E.W.LinHuang, T.W.T.W.HuangLo, D.C.W.D.C.W.LoWang, H.H.WangYang, D.C.D.C.YangDow, G.S.G.S.DowHUEI WANGTIAN-WEI HUANG2020-06-042020-06-041996https://scholars.lib.ntu.edu.tw/handle/123456789/497420Versatile W-band on-wafer MMIC test setconference paper10.1109/ARFTG.1996.3271692-s2.0-85060904698https://www.scopus.com/inward/record.uri?eid=2-s2.0-85060904698&doi=10.1109%2fARFTG.1996.327169&partnerID=40&md5=7df69945afdfbf99c00fc03992736543